Announcing a Quality Information Framework (QIF)
Working Group (WG) Meeting at NIST on Dec 14, 2011

Co-located with the NIST Model-Based Engineering (MBE) &
Technical Data Package (TDP) Summit Dec 12 – 15, 2011

Purpose of the QIF WG meeting:

·        Introduce the Quality Information Framework (QIF) – what it is, what is its potential, its current status and progress

·        Continue work on unfinished QIF task items from the May, 2011 QIF meeting at Hilton Head, SC, USA 

·        Present and discuss project plan for First-Article Inspection (FAI) pilot

·        Discuss next step strategies for fruitful interaction with

o   The MTConnect Institute – quality on-machine; pilot tests of QMResults and MTConnect

o   PDES, LOTAR PMI, STEP AP242, CAx-IF groups – QMPlans and quality directives from CAD and QMS

QIF WG Meeting coordinates: 8:30 AM – 5:00 PM, Dec 14, 2011, The National Institute of Standards and Technology (NIST), 100 Bureau Drive, Gaithersburg, MD 20899, Shops Conference Room, Building 304

Responsible persons:

·        QIF meeting program chairman: Ray Admire – 972 603-2074 ray.admire@lmco.com

·        QIF meeting registration: Bailey Squier – 817 461-1092 bsquier@dmisstandard.org

·        QIF WG chairman: Bill Rippey – 301 975-3417 william.rippey@nist.gov

·        QIF meeting local arrangements chair: John Horst – 301 975-3430 john.horst@nist.gov

·        MBE & TDP meeting chairman: Paul Huang – 410 306-0751 paul.huang@us.army.mil

Text Box: Meeting sponsors:

 

MBE & TDP Summit 2011 content and registration: Those professionals desiring to attend this QIF WG meeting at NIST on Wednesday Dec 14, will surely benefit from attending the MBE & TDP Summit (Dec 12 – 15) co-located with the QIF meeting.   The Summit will address many topics of direct relevance to the QIF development effort, not in small part due to the fact that several metrologists will be speaking at the MBE & TDP Summit on the important topic of Model-based inspection, including DMSC board members, Curtis Brown and Ray Admire.  To view the Summit agenda and to register for the Summit, go to http://www.nist.gov/el/msid/tdpsummit_2011.cfm.  Registration for both the summit and the QIF WG meeting is free, but you must register. 

QIF meeting registration: At www.dmisstandard.org, select “QIF WG meeting at NIST Dec 14, 2011” and follow the instructions to register.  If you cannot attend in person, but would like to attend remotely, please indicate this preference as you register.    QIF meeting registrations (for in-person attendance) need to be made prior to close-of-business Dec 2, 2011, particularly if you are a non-US citizen, since some additional paper work needs to be performed in order to get you onto the NIST campus. 

Lodging Options:  Several hotels are available in and around Gaithersburg, MD.  Two of the closest to the NIST campus are the Gaithersburg Hilton, phone: 301 977-8900, address: 620 Perry Parkway, Gaithersburg, Maryland, United States 20877 and the Gaithersburg Holiday Inn, phone: 301 948-8900, address: 2 Montgomery Village Ave.  Gaithersburg, MD 20879. 

QIF meeting agenda:

Time

Subject

Facilitator/Presenter

0830

Welcome, introductions, and local knowledge; state meeting goals, gather meeting expectations, and proposed agenda  (.5h)

Admire / Horst

0900

QIF: what it is, its potential, current status, and progress

Rippey

0930

Update on FAI pilot project

Admire

1030

Break

 

1045

PDES, LOTAR PMI, STEP AP242, CAx-IF groups – QMPlans and quality directives from CAD and QMS report and discussion

Horst / Maggiano

1130

The MTConnect Institute – quality on-machine; pilot tests of QMResults and MTConnect

Rippey / Horst

1215

LUNCH (on your own)

 

1315

Work on unfinished QIF task items from the May, 2011 QIF meeting

Rippey / All

1700

Meeting adjourn

 

 

Who should attend:  Technology users: Engineering staff of companies that use computer aided quality tools like Coordinate Measuring Machines, Statistical Process Control software, and quality planning systems who wish to join the effort, or to express their requirements for information standards. Technology developers and vendors: implementers of products that output, export, input, or import information describing measurement results, plans, or programs, who wish to contribute to the specifications to meet their customers' needs.   The QIG WG meeting will begin with a short introduction to QIF so interested newcomers are invited.  The DMSC welcomes meeting observers, and efforts will be made to answer any questions.  

Text Box: What is QIF?

The Quality Information Framework (QIF) is an integrated and holistic set of information models in XML Schema, which, if widely adopted, will enable the effective and efficient exchange of metrology data throughout the entire manufacturing quality measurement process – as illustrated in the figure.  The scope of QIF initially focuses on dimensional metrology using CNC CMMs, but QIF scope is also expected to include point cloud metrology, as well as binary and attribute measurements.  Past standard efforts in manufacturing quality systems have suffered from too narrow a focus or from too complex a data model.  A set of beta versions of high priority data models have been developed and are available QIF project include 1) a QIF schema library, 2) a Quality Measurement Results (QMResults) schema, and 3) a Quality Measurement Plans (QMPlans) schema.  A new modeling method, used to model quality characteristics and measurement features, is able to cover different use cases such as reverse engineering, batch quality measurement, and discrete quality measurement. Correct semantic associations between measurement feature and quality characteristics, and between nominal values and actual values are guaranteed by implementing strong typing using identifiers.